목록 New hot-carrier degradation phenomenon in nano-scale floating body MOSFETs Conference Proc. of Int. Rel. Phys. Symp. Author J.-W. Yang, H.R.Harris, C.Y. Kang, C.D. Young, K.T. Lee, H.D. Lee, G. Bersuker, B.H. Lee, H.-H. Tseng, R. Jammy Year 2008 Date 2008 학회구분 International File 2008_IRPS_JWYANG.pdf (177.7K) 0회 다운로드 DATE : 2021-04-01 19:11:09