포항공대 EESL Fearless challenge

New hot-carrier degradation phenomenon in nano-scale floating body MOSFETs

Conference

Proc. of Int. Rel. Phys. Symp.

Author

J.-W. Yang, H.R.Harris, C.Y. Kang, C.D. Young, K.T. Lee, H.D. Lee, G. Bersuker, B.H. Lee, H.-H. Tseng, R. Jammy

Year

2008

Date

2008

학회구분

International

File

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