포항공대 EESL Fearless challenge

A Comprehensive and Comparative Study of Interface and Bulk Characteristics of nMOSETs with La-Incorporated High-k Dielectrics

Conference

Proc. of Int. Electron Device Meeting, p.111

Author

W.-H. Choi, H.-M. Kwon*, I.-S. Han*, T.-G. Goo*, M.-K. Na*, C.Y. Kang, G. Bersuker, B.H. Lee, Y.H. Jeong, H.-D. Lee, R. Jammy

Year

2008

Date

2008

학회구분

International

File

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