목록 게시판 리스트 옵션 검색 A Comprehensive and Comparative Study of Interface and Bulk Characteristics of nMOSETs with La-Incorporated High-k Dielectrics Conference Proc. of Int. Electron Device Meeting, p.111 Author W.-H. Choi, H.-M. Kwon*, I.-S. Han*, T.-G. Goo*, M.-K. Na*, C.Y. Kang, G. Bersuker, B.H. Lee, Y.H. Jeong, H.-D. Lee, R. Jammy Year 2008 Date 2008 학회구분 International File 2008_IEDM_WHCHOI.pdf (275.1K) 0회 다운로드 DATE : 2021-04-01 19:28:25