Dielectric Breakdown Characteristics of Stacked High-k Dielectrics
Conference
Electrochem. Soc. Transaction (ECS), San Francisco, 19(2), p.289
Author
B.H.Lee, R.Choi
Year
2009
Date
2009, Invited
학회구분
International
File
2009_ECS_BHLEE.pdf (264.8K) 0회 다운로드 DATE : 2021-04-01 19:31:25